The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 23, 2004

Filed:

Mar. 25, 2002
Applicant:
Inventors:

Junji Kurachi, Takarazuka, JP;

Kazuishi Mitani, Takarazuka, JP;

Yasuhiro Saito, Takatuki, JP;

Assignee:

Hoya Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 2/1302 ;
U.S. Cl.
CPC ...
H01L 2/1302 ;
Abstract

There is provided a substrate for information recording media and a manufacturing method thereof, which allow an information recording medium to be driven reliably and stably even when the flying height is made lower than conventionally to cope with increased recording density of the data zone. Precision polishing is carried out on a glass substrate using a polishing agent. After the precision polishing, surface treatment is carried out using an etching liquid containing both hydrofluoric acid and a fluoride salt.


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