The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 23, 2004

Filed:

Oct. 30, 2002
Applicant:
Inventor:

Kaiser H. Wong, Torrance, CA (US);

Assignee:

Xerox Corporation, Stamford, CT (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 2/14763 ;
U.S. Cl.
CPC ...
H01L 2/14763 ;
Abstract

The invention is directed to a fabrication method of copper interconnects using dual damascene processing. Using silicon to provide an active surface, palladium can be selectively deposited on silicon by an immersion plating technique. After palladium deposition (about 1000 Å thick), either a layer of cobalt phosphorus or alloy cobalt/nickel phosphorus or nickel phosphorus is deposited on the palladium layer using an electroless plating technique. This cobalt phosphorus, cobalt/nickel phosphorus alloy, or nickel phosphorus layer serves as a copper diffusion barrier. The via and trenches are filled with copper by an electroless copper plating method and CMP is used to remove the excess copper and planarize-/-polish the copper/dielectric surface.


Find Patent Forward Citations

Loading…