The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 23, 2004
Filed:
Dec. 11, 2002
Sang-Eun Lee, Anyang-si, KR;
Samsung Electronics Co., Ltd., Suwon-si, KR;
Abstract
An apparatus rotates a sample to facilitate an accurate analysis of the sample. The apparatus includes a sample stage on which a plurality of samples are supported, a rotatable cap and a linearly movable plate for placing a selected one of the samples at an analysis position, and a rotating stage that supports the sample stage, rotatable cap and movable plate. The rotating stage is rotatable about an axis of rotation that intersects the analysis position. Once the selected sample is placed at the analysis position by the rotation of the cap and the linear movement of the plate, the selected sample is rotated by the rotating stage. The analysis process can be selectively or sequentially carried out with respect to the plurality of samples with a high degree of efficiency and without the associated drive mechanisms experiencing high loads.