The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 16, 2004
Filed:
Mar. 22, 2002
John M Chambers, Summit, NJ (US);
David A James, Morristown, NJ (US);
Diane Lambert, Berkeley Heights, NJ (US);
Scott Alan Vander Wiel, Fanwood, NJ (US);
Lucent Technologies Inc., Murray Hill, NJ (US);
Abstract
In a method for acquiring statistical information from data, an initial cumulative distribution function (CDF) that characterizes an initial set of data is acquired. The acquisition of this CDF comprises acquiring a set of quantile endpoints that define the CDF. At least one additional CDF, which characterizes a further set of data, is also acquired. Information that describes the initial CDF is combined with information that describes one or more additional CDFs, and the result is used to obtain a composite CDF that describes a combined set of data that includes the initial data set and the one or more further data sets. Then, a new set of quantile endpoints is determined, that defines the composite CDF. The sequence of steps described above is repeated at least once more. The previously obtained composite CDF is used as the initial CDF for each repetition of this sequence.