The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 16, 2004

Filed:

Oct. 19, 2000
Applicant:
Inventors:

Yoon-seop Eom, Suwon, KR;

Yong-baek Yoo, Suwon, KR;

Seung-deog An, Yongin, KR;

Jong-woo Kim, Suwon, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03G 1/510 ;
U.S. Cl.
CPC ...
G03G 1/510 ;
Abstract

A developer concentration measuring apparatus of a liquid printer includes a container installed so that developer supplied to a photoreceptor web enters and is exhausted, a roller rotatably installed in the container for forming a film of the developer contained in the container on a surface thereof being exposed while rotating, a roller driving module for driving the roller to rotate at a predetermined speed, a light emitting module for emitting a predetermined amount of light to the surface of the roller where the film is formed, a light-receiving module, installed to detect light emitted from the light emitting module and passing through the film, for transmitting a signal corresponding to the amount of received light, a temperature detector for detecting the temperature of the developer contained in the container; and a concentration measuring module for measuring the concentration of the developer from information on temperature output from the temperature detector and from the signal output from the light-receiving module. Thus, by obtaining the information on the temperature of developer and measuring the concentration of the developer appropriate to the obtained temperature information, generation of concentration measurement errors is lowered.


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