The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 16, 2004
Filed:
Nov. 27, 2002
Barry Eppler, Loveland, CO (US);
Agilent Technologies, Inc., Palo Alto, CA (US);
Abstract
An x-ray laminography imaging system and an apparatus and method for calibrating the system. The x-ray laminography imaging system utilizes a stationary x-ray source and generates a moving pattern of x-ray spots on a target anode synchronously with rotation of an x-ray detector to reduce or eliminate the need to move an object being imaged. The present invention provides an apparatus and a method for calibrating the system based in part on empirical data gathered during physical calibration and in part on data analytically derived from the empirical data. Because calibration of the system can be performed in great part analytically rather than relying entirely on empirically generated data, the calibration process can be performed very quickly.