The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 16, 2004
Filed:
Jun. 02, 2000
Applicant:
Inventors:
Junji Tominaga, Tsukuba, JP;
Nobufumi Atoda, Tsukuba, JP;
Hiroshi Fuji, Kyoto, JP;
Hiroyuki Katayama, Nara, JP;
Kenji Ohta, Nara, JP;
Assignee:
Other;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B 7/00 ;
U.S. Cl.
CPC ...
G11B 7/00 ;
Abstract
An optical sample includes a mask layer made of a material in which an aperture is produced by a chemical change, which is reversible, upon application of heat or light, and a recording layer provided at a position where an evanescent field produced in the aperture when light is applied to the mask layer can reach. Since the aperture is produced in the mask layer by a chemical change, it can be opened and closed at a high speed and hence a high-speed transfer of information can be achieved.