Semiconductor memory device with built-in self-diagnostic function and semiconductor device having the semiconductor memory device

Abstract

A semiconductor memory device having a self-diagnostic test function which enables flexible adjustment to change and addition of test specifications without having to perform complicated control with a complicated and large-scale circuit structure is provided. As memory operation specification information, capacity information R , bus width information R , and burst length information R are inputted from the outside and stored in a capacity information storing circuit , a bus-width-information storing circuit , and a burst-length-information storing circuit . The stored information R to R is inputted to a max./min. value generator circuit , and a maximum address AMAX and a minimum address AMIN are generated at the max./min. value generator circuit . Since the memory operation specification information such as the information R to R is rewritten from the outside, the maximum address AMAX and the minimum address AMIN in an address space can be set in accordance with the specifications.