The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 16, 2004
Filed:
Nov. 19, 2002
Bettina Baumeister, Würenlingen, CH;
Thomas A. Jung, Thalwil, CH;
Ernst Meyer, Muttenz, CH;
Christoph Walter, Haegendorf, CH;
Laura Heyderman, Zofingen, CH;
Paul Scherrer Institut (PSI), Villigen, CH;
Abstract
The invention is essentially characterized in that in a first step a substrate is provided, which is coated with defined pattern of protrusions of a coating layer of a different material, so that an interface is defined between the substrate and the coating layer. As an example, the patterned coating layer can be applied by first forming an essentially homogeneous coating layer, which is then partially removed by means of photolithographic and etching techniques, leaving nanometer sized protrusions in that layer. As a next step, the surface provided with these structures is modified by selectively removing protrusions by means of a micro-device. Such a micro-device can be formed in a similar way to a scanning probe microscope (SPM) tip. The presence or absence of a protrusion represents a readable data bit information.