The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 16, 2004
Filed:
Nov. 29, 2001
Shoichi Aoki, Tokyo, JP;
Sinya Nagashima, Tokyo, JP;
Ando Electric Co., Ltd., Tokyo, JP;
Abstract
An optical fiber chromatic dispersion distribution measuring apparatus for measuring the chromatic dispersion distribution of an optical fiber under test comprising two light sources at least one of which can change wavelength thereof, wherein light beams having different wavelengths from each other and emitted from the two light sources are inputted to the optical fiber under test to measure a four-wave mixing light beam generated by interaction between the two light beams by optical time domain reflectometer (OTDR); wherein an optical bandpass filter having a fixed center wavelength is provided at a previous stage of the optical time domain reflectometer (OTDR); and wherein a coherence controller for controlling coherence of at least one of the light beams outputted from the two light sources.