The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 16, 2004

Filed:

Oct. 10, 2001
Applicant:
Inventors:

Ramkumar Subramanian, San Jose, CA (US);

Michael K. Templeton, Atherton, CA (US);

Bharath Rangarajan, Santa Clara, CA (US);

Assignee:

Advanced Micro Devices, Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 2/155 ; G01N 2/100 ;
U.S. Cl.
CPC ...
G01N 2/155 ; G01N 2/100 ;
Abstract

A system and method is provided that facilitates the uniform development of a pattern on a photoresist material layer using a developer. The present invention accomplishes this end by considering the acid-base relationship of the photoresist material and developer and monitoring the development of water formed in the development process. Typically, photoresist material is purchased or manufactured with known concentrations of resin and photoacid generator. Therefore, by monitoring the development of water in the development process, the present invention can measure the acid consumption in the development process. The present invention can then utilize this information in optimizing the developer volume, developer concentration and developer time to improve the quality of the developed image pattern on the photoresist material layer.


Find Patent Forward Citations

Subramanian, Ramkumar. (2004). Apparatus of monitoring and optimizing the development of a photoresist material (U.S. Patent No. 6819427). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6819427

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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