The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 16, 2004
Filed:
Feb. 22, 2002
Teruyuki Ishibashi, Shizuoka, JP;
Kazuyoshi Tomikawa, Shizuoka, JP;
Yazaki Corporation, Tokyo, JP;
Abstract
In a terminal crimped state testing method, in step S , a reference waveform is created on the basis of a load when a terminal in a good crimped state is obtained, and the reference waveform is divided into plural reference waveform segments to set singular points. In step S , the reference waveform segments containing singular points of the segments are integrated. In step S , a characteristic waveform is created on the basis of the load when a crimping terminal to be tested is obtained. The characteristic waveform thus created is divided into plural sample waveform segments and the waveform segments corresponding to the reference waveform segments are integrated. In step S , the integrated values of the reference waveform segments are compared with those of the sample waveform segments, thereby deciding whether the crimped state of the crimping terminal is good or not. In this configuration, the terminal crimped state can be stably tested, the defectiveness is precisely detected, and the time taken for testing can be shortened.