The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 16, 2004

Filed:

Nov. 22, 2002
Applicant:
Inventors:

Otto N. Fanini, Houston, TX (US);

Gulamabbas A. Merchant, Houston, TX (US);

Assignee:

Baker Hughes Incorporated, Houston, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/18 ; G01V 3/28 ;
U.S. Cl.
CPC ...
G01V 3/18 ; G01V 3/28 ;
Abstract

The invention is a method of determining horizontal and vertical resistivity in an anisotropic formation using a combination of orientable triaxial and array antennae conveyed downhole. Measurements are taken at various azimuthal angles about a measuring device at a given depth. Values at each azimuthal orientation can be fit to a curve to yield information on the surrounding formation. Multiple measurements at a given depth and azimuthal orientation can be weighted to obtain an average value. Values from the curve fitting process are used in subsequent inversion processing and reduce the uncertainty of the inversion processing result. Utilization of a three dimensional geometry enables a unique resolution of the orientation of the principle axis of anisotropy, and consequently of horizontal and vertical resistivity, and dip.


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