The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 16, 2004
Filed:
Jul. 01, 2002
David A. Luce, Clarence Center, NY (US);
Reichert, Inc., Depew, NY (US);
Abstract
A novel tonometry method wherein measured intraocular pressure corresponding to inward applanation of the cornea and corneal hysteresis derived from a pressure differential associated with inward and outward applanation events in the same measurement pulse allows comparison with a predetermined population normality function to avoid corneal effects so that the actual status of intraocular pressure can be ascertained. A dual mode non-contact tonometer allows selection between a standard measurement mode for patient comfort and an alternate measurement mode wherein pressure-time characteristics of the fluid pulse are varied to allow additional observation of corneal hysteresis associated with the dynamic measurement process for carrying out the novel tonometry method. Corresponding tonometry method embodiments include a method adapted for a contact tonometer and a method based on a pair of non-contact tonometer measurements taken using different air pulse pressure ramp rates.