The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 09, 2004

Filed:

Nov. 13, 2001
Applicant:
Inventors:

Gunawan Ali-Santosa, Milpitas, CA (US);

Mehrdad Mojgani, Cupertino, CA (US);

Assignee:

Sun Microsystems, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/100 ;
U.S. Cl.
CPC ...
G06F 1/100 ;
Abstract

A method for detecting corrupt software code includes defining a correlation rule for a program, writing the program to a memory device and reading two or more of the markers from the memory device. The program includes at least one segment. Each segment includes executable codes and the segments include multiple markers. The correlation rule defines a relationship between two or more of the markers. The method also includes determining whether one of the segments is corrupt by applying the correlation rule to the markers read from the device and indicating whether one of the segments is corrupt based upon the determination.


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