The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 09, 2004
Filed:
Nov. 30, 2001
Applicant:
Inventors:
Karin Julliard, Sunnyvale, CA (US);
Steve Utter, Livermore, CA (US);
Alan B. Petersen, Palo Alto, CA (US);
Assignee:
Spectra Physics, Inc., Mountain View, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01S 3/00 ;
U.S. Cl.
CPC ...
H01S 3/00 ;
Abstract
A method and apparatus are provided for in situ protection of sensitive optical materials from alternation or damage due to exposure to trace atmospheric components, during shipping, storage or operation. The sensitive optical material is disposed within an enclosure adaptable to be substantially sealed against the external atmosphere. A container, enclosing a sink material absorbing trace atmospheric components, is coupled to the enclosure by a gas permeable surface, which allows fast diffusion of the trace atmospheric component inside the enclosure to the sink material.