The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 09, 2004
Filed:
May. 06, 2002
Applicant:
Inventors:
Jin Xu, Singapore, SG;
Kai Meng Hock, Singapore, SG;
Assignee:
Sony Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 7/00 ;
U.S. Cl.
CPC ...
G11B 7/00 ;
Abstract
Data is recovered from a write-once optical disk having data written on it. The disk is composed of a substrate and a dye layer. The data was originally written to the dye layer as patterns of pits and lands, but the dye layer is subject to corruption due to ageing so that the data cannot be read by a conventional read process. The data is recovered by exposing the surface of the substrate, measuring deformations to that layer caused by the write process, and extracting the data from the measured deformations by classifying the measured deformations into deformations typical of predetermined patterns of pits and lands.