The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 09, 2004

Filed:

Mar. 08, 2002
Applicant:
Inventors:

Hisanori Akiyama, Shinjyuku-ku, JP;

Toshiro Yoda, Shinjyuku-ku, JP;

Assignee:

Hoya Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/00 ;
U.S. Cl.
CPC ...
G01B 9/00 ;
Abstract

The present invention provides an inexpensive and convenient method and apparatus for measuring light transmittance of an optical lens having refractive power. The method comprises obtaining the light transmittance of an examined lens from a value corresponding to a ratio between the intensity of measured light detected by a light detector when the examined lens is placed in the path of the measured light emitted from a light source and an intensity of measured light detected by the light detector when there is no lens undergoing examination placed in the path of the measured light so that the measured light does not pass through an examined lens and provides a baseline value. Specifically, the present invention focuses (converges) the measured light at or in a vicinity of a position where the examined lens is disposed when the examined lens is placed in the path of the measured light.


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