The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 09, 2004

Filed:

Jul. 19, 2002
Applicant:
Inventors:

Nimita J. Taneja, Castro Valley, CA (US);

Nathaniel David Naegle, Pleasanton, CA (US);

Michael F. Deering, Los Altos, CA (US);

Assignee:

Sun Microsystems, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/300 ;
U.S. Cl.
CPC ...
G06F 1/300 ;
Abstract

A system and method is disclosed for management of sample data to enable video rate anti-aliasing convolution. Sample data may be moved simultaneously from a sample buffer to a bin scanline cache and from the bin scanline cache to an array of N processor—memory units (e.g. 25 for N=5). Pixel data may be convolved from an N×N sample bin array that may be approximately centered on the pixel location. Since each sample bin contains N samples, N ×N samples may be filtered for each pixel (e.g. 400 for N=5 and N =16). Each processor—memory unit convolves the sample data for one sample bin in the N×N sample bin array and supports a variety of filter functions. Pixel data may be output to a real time video data stream.


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