The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 09, 2004

Filed:

May. 20, 2003
Applicant:
Inventors:

Shoji Nara, Yokohama, JP;

Hui Jiang, Yokohama, JP;

Wataru Yamamoto, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 3/100 ;
U.S. Cl.
CPC ...
G01R 3/100 ;
Abstract

An inspection method and device are provided. The inspection method includes charging a parasitic capacitor between the gate and the drain of an operating transistor by supplying a potential from an inspection device, measuring discharge current from the parasitic capacitor by using the inspection device by discharging the parasitic capacitor, and determining whether or not a defect exists in each of a plurality of pixels by using the inspection device based on a value of the discharge current.


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