The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 09, 2004

Filed:

Jan. 09, 2003
Applicant:
Inventors:

William David Iwanicki, Calgary, CA;

Wade Stewart Maxfield, Weatherford, TX (US);

Stephanie A. Michels, Clebume, TX (US);

Peter J. Schoch, Fort Worth, TX (US);

Assignee:

Computalog USA, Inc., Fort Worth, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/18 ;
U.S. Cl.
CPC ...
G01V 3/18 ;
Abstract

Using micro-resistivity techniques, an image of the wall of a borehole can be obtained. A downhole tool stack is provided with plural imaging tools, wherein each imaging tool has a set of pads that deploy radially outward to contact the borehole wall to obtain the image thereof. As the pads deploy outwardly, gaps are formed between the pads. The pads of one tool are circumferentially offset relative to the pads of the other tool so that more complete circumferential coverage of the borehole wall is obtained during the imaging process. Furthermore, an adaptive polling technique is utilized to telemeter the large amounts of data generated by the two imaging tools to the surface. Data is obtained from the imaging tools by polling at a particular rate, which rate is modified depending upon the amount of data generated by the imaging tools.


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