The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 09, 2004

Filed:

Jun. 28, 2001
Applicant:
Inventors:

Michael R. Harms, Mendota Heights, MN (US);

William Bedingham, Woodbury, MN (US);

Christopher R. Kokaisel, Mendota Heights, MN (US);

Barry W. Robole, Woodville, WI (US);

Kenneth B. Wood, St. Paul, MN (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B01L 3/00 ; B01L 3/02 ; G01N 2/100 ; G01N 3/122 ; G01N 1/506 ;
U.S. Cl.
CPC ...
B01L 3/00 ; B01L 3/02 ; G01N 2/100 ; G01N 3/122 ; G01N 1/506 ;
Abstract

Methods and devices for thermal processing of multiple samples at the same time are disclosed. The assemblies include carriers and sample processing devices with process arrays that include conduits useful in distributing sample materials to a group pf process chambers located in fluid communication with the main conduits. The sample processing devices may include one or more of the following features in various combinations: deformable seals, process chambers connected to the main conduit by feeder conduits exiting the main conduit at offset locations, U-shaped loading chambers, and a combination of melt bonded and adhesively bonded areas. The carriers may be used to apply selective compression to the sample processing devices.


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