The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 02, 2004
Filed:
Nov. 29, 2001
Mike Peng Li, Palo Alto, CA (US);
Jan Brian Wilstrup, Mounds View, MN (US);
Wavecrest Corporation, Eden Prairie, MN (US);
Abstract
A system for determining a response characteristic of an nth order linear system, such as a phase locked loop, is disclosed. An input signal is supplied to the linear system, and the system measures an output signal produced by the linear system. A variance record is constructed for a measurable quantity, such as jitter, extracted from the output signal. The response characteristic of the linear system is then obtained from the variance record. The response characteristic, such as the transfer function, noise processes, and/or power spectral density (PSD), may be found through a numerical or analytical solution to a mathematical relationship between a response function of the nth order linear system and the variance record.