The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 02, 2004

Filed:

Dec. 20, 2000
Applicant:
Inventor:

Jamie L. Kawabata, Austin, TX (US);

Assignee:

Eastman Kodak Company, Rochester, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/32 ;
U.S. Cl.
CPC ...
G06K 9/32 ;
Abstract

An image alignment method and system for aligning two digital images which were intended to be scanned from the same portion of medium, but which may be skewed somewhat. A portion of the first digital image is selected as the target region and a portion of the second digital image is selected as a variable or movable region. Data from the two regions can be subjected to a mathematical or statistical algorithm which determines how well the data from the regions match or correlate. Then, a new region can be selected to serve as the variable region from the second digital image and the correlation algorithm can be conducted again. This process can be repeated on a number of regions from the second digital image. Regions having the highest mathematical correlation can then be used to determine offsets which indicate the amount of skew or misalignment between the two digital images.


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