The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 02, 2004

Filed:

Oct. 19, 2001
Applicant:
Inventors:

Reiner Koppe, Hamburg, DE;

Erhard Paul Arthur Klotz, Neumuenster, DE;

Johannes Catharina Antonius Op De Beek, Eindhoven, NL;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 2/300 ;
U.S. Cl.
CPC ...
G01N 2/300 ;
Abstract

A method and system of forming an X-ray layer image of an object being examined by an X-ray device having an X-ray source and an X-ray detector is described. At least one of the X-ray source and the X-ray detector can be displaced in an angular range around the object in order that X-ray projection images are acquired from different directions. When forming only a single X-ray layer image, or a plurality of X-ray layer images of parallel layers of the object, the time required for the acquisition of the X-ray projection images is notably reduced by forming the X-ray layer image directly from the X-ray projection images, where the resulting X-ray layer image is situated in a plane which extends essentially perpendicularly to the bisector of the angular range of displacement. The angular range of displacement can be less then 180°. The system and method is notably applicable to a C-arm X-ray device, in which the angular range can be chosen at will.


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