The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 02, 2004

Filed:

Jan. 17, 2003
Applicant:
Inventors:

Nanguang Chen, Mansfield Center, CT (US);

Qing Zhu, Mansfield Center, CT (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 2/608 ;
U.S. Cl.
CPC ...
G02B 2/608 ;
Abstract

A high speed, high duty cycle, linear, optical scanning device suitable for optical coherence tomography, optical coherence microscopy and confocal microscopy is presented. For the microscopy applications stable, periodic scanning is achieved by using a rotary mirror array, having a rotational symmetry and mirrors tilted at a small angle with respect to the rotational plane. The rotary mirror array is rotated at a constant speed. For the tomography application periodic modulation of the optical path-length of the reference beam is controlled by the rotation of the rotary mirror array.


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