The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 02, 2004
Filed:
Jul. 25, 2002
Gregory D. Vanwiggeren, Los Gatos, CA (US);
Agilent Technologies, Inc., Palo Alto, CA (US);
Abstract
A method and system for calibrating an interferometric optical network analyzer is disclosed. Specifically, a plurality of interferometric measurements for a control optical element using first polarized lightwaves of a first amplitude and second polarized lightwaves of a second amplitude are received in accordance with the invention. Next, a calibration result is derived using the plurality of interferometric measurements in accordance with the present invention. With this calibration result, the optical properties of a device under test (DUT) measured using the first polarized lightwaves of the first amplitude and the second polarized lightwaves of the second amplitude can be determined with reduced uncertainty due to intrinsic optical characteristics of the interferometric optical network analyzer.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile