The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 02, 2004

Filed:

Aug. 28, 2003
Applicant:
Inventor:

Takemi Beppu, Oizumi-machi, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/126 ; G01R 1/04 ; H01H 3/102 ;
U.S. Cl.
CPC ...
G01R 3/126 ; G01R 1/04 ; H01H 3/102 ;
Abstract

There has been no appropriate means to test connections between two integrated circuits packaged in a single semiconductor package. This invention offers a test method on internal connections in a semiconductor package housing a first integrated circuit and a second integrated circuit connected with each other, including applying a test signal to a first pin of the semiconductor package, applying the test signal from the first pin to the first integrated circuit, applying a first signal generated in the first integrated circuit from the test signal to the second integrated circuit, applying a second signal generated in the second integrated circuit from the first signal back to the first integrated circuit, leading a third signal generated in the first integrated circuit from the second signal out of the semiconductor package through a second pin of the semiconductor package and confirming connections between the first integrated circuit and the second integrated circuit by verifying the third signal led out of the semiconductor package.


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