The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 02, 2004

Filed:

Mar. 05, 2002
Applicant:
Inventor:

Johann Hipp, Hamburg, DE;

Assignee:

Sick AG, , DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 4/014 ;
U.S. Cl.
CPC ...
H01J 4/014 ;
Abstract

A method for monitoring a protected zone in which a light ray is transmited by an apparatus in the direction of the protected zone, a light ray reflected/remitted by an object disposed in the protected zone is received and the distance between the apparatus and the object is determined. The arrangement is such that at least two light rays are transmitted which include an angle between them; that, with an object present inside the protected zone, a first light ray reflected/remitted by the object is received; that, with an object-free protected zone, a second light ray reflected/remitted from a location disposed outside the protected zone is received; and that the distance from the apparatus of both the object and the second location is determined. Furthermore the present invention relates to a corresponding apparatus.


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