The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 02, 2004

Filed:

Jul. 01, 2003
Applicant:
Inventors:

Hidetaka Nishida, Higashihiro Shima, JP;

Hiroshi Yamaguchi, Hiroshima, JP;

Nobuaki Kosako, Hiroshima, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 3/00 ;
U.S. Cl.
CPC ...
G01N 3/00 ;
Abstract

A part where a creep void is recognized is observed at an arbitrary magnification by a scanning electron microscope, an optical microscope, and a laser microscope, and the maximum value of creep void crystal grain boundary occupancy is measured in the field of view. The maximum value is applied to a a master curve corrected from the results of a test of simulating an actual machine and a test piece of actual machine size, taking account of internal damage of the machine. Thus the creep lifetime consumption rate of a member is estimated easily with high accuracy.


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