The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 02, 2004
Filed:
Jan. 10, 2003
Applicant:
Inventors:
Bary W. Wilson, Richland, WA (US);
Timothy J. Peters, Richland, WA (US);
Chester L. Shepard, West Richland, WA (US);
James H. Reeves, Richland, WA (US);
Assignee:
Battelle Memorial Institute, Richland, WA (US);
Primary Examiner:
Int. Cl.
CPC ...
G01N 1/100 ;
U.S. Cl.
CPC ...
G01N 1/100 ;
Abstract
The present invention is an apparatus and method for analyzing a fluid used in a machine or in an industrial process line. The apparatus has at least one meter placed proximate the machine or process line and in contact with the machine or process fluid for measuring at least one parameter related to the fluid. The at least one parameter is a standard laboratory analysis parameter. The at least one meter includes but is not limited to viscometer, element meter, optical meter, particulate meter, and combinations thereof.