The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 26, 2004
Filed:
Dec. 07, 1999
Manoj Unnikrishnan, Santa Clara, CA (US);
Gurushankar Rajamani, Sunnyvale, CA (US);
Hewlett-Packard Development Company, L.P., Houston, TX (US);
Abstract
A method of and system for generating tests and using the tests to identify VLSI simulation and circuit operation faults and errors and validate performance uses a genetic algorithm. Each generation of tests is further processed to eliminate redundant tests and make room for the insertion of new genetic material into the population in the form of random test vectors. The resulting family of tests generated using a simulation of the VLSI can then be ported to the circuit once prototyped in silicon and adapted to the new environment using, once again, the genetic algorithm to suitably evolve the test population.