The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 26, 2004
Filed:
May. 06, 2002
Applicant:
Inventor:
Gregory A. Dahlen, Santa Barbara, CA (US);
Assignee:
Veeco Instruments Inc., Woodbury, NY (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 1/504 ;
U.S. Cl.
CPC ...
G01B 1/504 ;
Abstract
A method of extracting the shape of a probe tip of a probe-based instrument from data obtained by the instrument is provided. The method generates an image using the data wherein the data is indicative of a characteristic of a surface of a sample. The method then calculates a slope of the image at a particular region and determines, using the slope, a probe contact point between the tip and the sample at that region. In addition, the method further includes the steps of translating the image point based on the probe contact point and repeating the above steps for at least two points in the image data so as to generate a corrected image plot.