The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 26, 2004
Filed:
Dec. 19, 2002
John T. Flower, Longmont, CO (US);
Christopher S. Wood, Boulder, CO (US);
Shirley Thorkelson, Belgrade, MT (US);
ILX Lightwave Corporation, Bozeman, MT (US);
Abstract
An integrating optical system for measuring optical radiation. The system has a first sphere (forming a “primary” integrating cavity) and a second sphere (forming a “secondary” integrating cavity). An optical fiber interfaces to an input aperture of the first sphere so that light from the fiber enters the first sphere. A detector interfaces with the second sphere such that light from the first sphere couples to the detector by scattering within the first and second spheres and without a direct line of sight between the detector and the input aperture. The secondary integrating cavity has a smaller volume than the primary integrating cavity. The secondary integrating cavity is made smaller so as to decrease losses incurred by light scattering transmission through the first and second spheres. The detector is preferably configured so that it does not receive “specular” radiation (i.e., radiation from a single reflection) from the walls of the primary cavity.