The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 26, 2004
Filed:
Jun. 24, 2003
Applicant:
Inventors:
Jiang Hsieh, Brookfield, WI (US);
Robert H. Armstrong, Waukesha, WI (US);
Peter Joseph Arduini, Wauwatosa, WI (US);
Robert F. Senzig, Germantown, WI (US);
Assignee:
GE Medical Systems Global Technology Company, LLC, Waukesha, WI (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/02 ;
U.S. Cl.
CPC ...
A61B 6/02 ;
Abstract
A method includes augmenting partially sampled field of view data using fully sampled field of view data.
Hsieh, Jiang. (2004). Methods and apparatus for truncation compensation (U.S. Patent No. 6810102). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6810102
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile