The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 26, 2004

Filed:

Jan. 29, 2001
Applicant:
Inventors:

Eun-Ee Cho, Daegu-kwangyeok-shi, KR;

Ho Kim, Seoul, KR;

Jong-Hyeon Park, Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04J 1/100 ;
U.S. Cl.
CPC ...
H04J 1/100 ;
Abstract

Disclosed is an apparatus for measuring a bit error rate (BER) in an orthogonal frequency division multiplexing (OFDM) communication system. A transmitter includes a pilot pattern inserter for inserting a first reference pilot pattern in subchannels of input data, and an OFDM modulator for OFDM-modulating the reference pilot pattern-inserted transmission data. A receiver includes a pilot pattern detector for OFDM-demodulating a data symbol received in a frame unit and detecting only a pilot pattern, and a BER operator for comparing the demodulated pilot pattern with a second reference pilot pattern, detecting and accumulating the number of pilot errors, and measuring a bit error rate by dividing the accumulated number of the pilot errors by the number of total received pilot patterns.


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