The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 26, 2004
Filed:
Feb. 26, 2003
Jae-Ho Lee, Kumi-shi, KR;
Sung-Koog Oh, Kumi-shi, KR;
Samsung Electronics Co., LTD, Gyeonggi-do, KR;
Abstract
The present invention relates to an apparatus for measuring the residual stress in an optical fiber which includes: a fixating unit for fixating an optical fiber with residual stresses to be measured therein; and a measuring unit comprising a light generator for generating a light for measuring the residual stresses in the optical fiber and a detector for detecting phase changes of the light that has been generated by the light generator; wherein the measuring unit measures the residual stresses in the optical fiber based on the phase changes of the light passed through the optical fiber, while the measuring unit is rotating along with the circumference of the optical fiber.