The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 26, 2004
Filed:
Dec. 20, 1999
Applicant:
Inventors:
Edwin W O'Brien, Bristol, GB;
Andrew R Ibbotson, Bristol, GB;
Assignee:
Airbus UK Limited, Bristol, GB;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01L 1/24 ; G01B 1/116 ; G01B 1/124 ; G01B 1/114 ; H01J 3/14 ;
U.S. Cl.
CPC ...
G01L 1/24 ; G01B 1/116 ; G01B 1/124 ; G01B 1/114 ; H01J 3/14 ;
Abstract
Apparatus and a method for inspecting a topology of a surface ( ) of a structural member ( ) are provided. The degree to which a known type of stress has been applied to the member may be ascertained using a Moiré grid ( ). The method involves providing a range of calibration samples of structurally equivalent members, the samples each having been subject to the known type of stress to a differing respective degree. Measurements taken using the apparatus and method of the invention are then compared with measurements taken from a calibration sample to determine the amount of stress which has been applied.