The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 26, 2004
Filed:
Dec. 11, 2001
Applicant:
Inventor:
Clive David Beech, Plymouth, GB;
Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/102 ; G01R 3/126 ;
U.S. Cl.
CPC ...
G01R 3/102 ; G01R 3/126 ;
Abstract
An integrated circuit test structure comprises a potential divider and an array of test circuits. Each test circuit comprises series-connected chains of integrated circuit connections between test voltage lines. Each test circuit also comprises a comparator in the form of a MOSFET having a gate connected to the center point of the chains and a source connected to the output of the potential divider. The drain of the transistor is connected to an input for a bias voltage.