The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 26, 2004
Filed:
Jan. 10, 2003
Applicant:
Inventors:
Brian Sadler, San Jose, CA (US);
Mohsen Hossein Mardi, San Jose, CA (US);
David M. Mahoney, Mountain View, CA (US);
Assignee:
Xilinx, Inc., San Jose, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/102 ; G01R 2/708 ; H01H 3/104 ;
U.S. Cl.
CPC ...
G01R 3/102 ; G01R 2/708 ; H01H 3/104 ;
Abstract
A method and apparatus for testing parasitic effects on conducting paths in high-speed systems using a test package which allows for very accurate measurements of the parasitic effects to be taken. The test package is designed to be nearly identical to the actual IC package and has an external connector to allow measurements to be taken through the package, instead of at a point close to the package.