The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 26, 2004
Filed:
Jul. 10, 2003
Applicant:
Inventors:
Toshio Ando, Kanazawa-shi, Ishikawa-ken, JP;
Akitoshi Toda, Kunitachi, JP;
Assignee:
Other;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 2/740 ; G01N 2/300 ; B23Q 1/709 ; G01B 5/28 ;
U.S. Cl.
CPC ...
G02B 2/740 ; G01N 2/300 ; B23Q 1/709 ; G01B 5/28 ;
Abstract
A scanning unit for moving an object to be moved along at least one axis, which comprises a first actuator for moving the object along a first axis, the first actuator having a pair of end portions, and the object being attached to one of the end portions, the first actuator being held at a position in the vicinity of the center in dimension or the center of gravity thereof.
Ando, Toshio. (2004). Scanning unit and scanning microscope having the same (U.S. Patent No. 6809306). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6809306
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile