The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 26, 2004
Filed:
Jan. 16, 2002
Mehmet Aslan, Milpitas, CA (US);
Richard Dean Henderson, Sunnyvale, CA (US);
Michael Wong, Santa Clara, CA (US);
Qing Feng Ren, San Jose, CA (US);
Chungwai Benedict Ng, Mountain View, CA (US);
Hideya Oshima, Santa Clara, CA (US);
National Semiconductor Corporation, Santa Clara, CA (US);
Abstract
A method and apparatus improves the accuracy of temperature measurements by sampling measurements from a remote sensor, where currents of different current densities are applied to the remote sensor in a time-interleaved fashion. The remote sensor includes at least one PN junction that produces a voltage corresponding to the applied current at each instance of time, and related to the temperature of the remote sensor. By applying time-interleaved current densities to the remote sensor, adverse effects from temperature variations during the measurement are minimized. Sequences of current biases having differing current densities in a forward order are applied to the remote sensor, followed by the same sequence being applied to the remote sensor in a reverse order. Similarly, a random or pseudo-random sequence may be employed in a forward and reverse order. The application of forward and reverse sequences is utilized to minimize errors in the temperature measurement.