The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 26, 2004

Filed:

Nov. 12, 2002
Applicant:
Inventor:

Jonathan Thayer, Nutley, NJ (US);

Assignee:

E-L Management Corp., New York, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A45D 2/400 ;
U.S. Cl.
CPC ...
A45D 2/400 ;
Abstract

A printed template and method for using the template are illustrated for evaluating various characteristics of eyelashes and categorizing the eyelashes accordingly. The template has one edge portion suitable for placement adjacent an eyelid under eyelashes. The edge portion is provided with indicia representing known eyelash characteristics such as density, thickness, length or color. The indicia on the template are placed adjacent actual eyelashes such that a visual comparison can be made between the eyelashes and the indicia. By comparing the eyelashes to the indicia, a user can more objectively determine the measurements and characteristics of the eyelashes.


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