The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 26, 2004

Filed:

Oct. 01, 2002
Applicant:
Inventor:

Sadao Omata, Koriyama, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 2/912 ;
U.S. Cl.
CPC ...
G01N 2/912 ;
Abstract

A noncontact physical property measurement instrument which easily and accurately measures physical properties of an object using a nondestructive, noncontact sensor. A noncontact physical property measurement instrument is provided with a transmitting section and a receiving section . The transmitting section sends a wave to an object in a medium , and the receiving section receives a wave reflected from the object and the surface of a coating . Both the transmitting section and the receiving section are connected to a gain change correction circuit to form a self-excited oscillating circuit serving as a feedback loop. The gain change correction circuit corrects the gain to the increase side according to a phase difference between the sent wave and the reflected wave, to thereby measure any changes due to a difference in physical properties of the object


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