The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6807835 B1

PDF
Full Text
Expired
Date of Patent:
Oct. 26, 2004

Filed:

Sep. 22, 2003
Applicant:
Inventors:

Katsuji Sekita, Kanagawa, JP;

Tadahiko Nagasawa, Kanagawa, JP;

Assignee:

Amada Company, Limited, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B21D 5/02 ; G06F 1/900 ; G06F 3/00 ;
U.S. Cl.
CPC ...
B21D 5/02 ; G06F 1/900 ; G06F 3/00 ;
Abstract

A system manufactures a product by bending a sheet material includes a three-dimensional stereoscopic diagram creator that creates a three-dimensional stereoscopic diagram, including a desired bending angle and a desired flange width, based on graphic information of a product. A displayer displays a bending angle value in the vicinity of a bending angle, and/or a dimension value in the vicinity of a flange, in the created three-dimensional stereoscopic diagram. A test piece displayer displays a test piece of a material proposed for use in the product and displays the bending angle value(s) in the vicinity of the bending angle(s), and/or the dimension value(s) in the vicinity of the flange(s), of the test piece. A measuring device measures the bending angle value(s) and the dimension value(s) for the test piece bent by the bending machine. A calculator that calculates a stroke value using a difference between the desired bending angle and the measured bending angle, and/or a back gauge value using a difference between the desired flange dimension and the measured flange dimension.


Find Patent Forward Citations

Sekita, Katsuji. (2004). Bending method and bending system (U.S. Patent No. 6807835). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6807835

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