The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 19, 2004
Filed:
Sep. 05, 2001
Shintaro Mori, Tokyo, JP;
Ando Electric Co., Ltd., Tokyo, JP;
Abstract
An IC test system comprises: a test pattern signal applying section for applying a test pattern signal to an IC to be tested, in accordance with a test program; a simulation section for simulating an operation of the test pattern signal applying section in accordance with a simulation program; and a management device which is connected detachably with the test pattern signal applying section, for managing the operation of the test pattern signal applying section and an operation of the simulation section in accordance with a management program, for storing information about each operation of the test pattern signal applying section and the simulation section, and for managing one of the information about the operation of the simulation section and the information about the operation of the test pattern signal applying section in accordance with the other information.