The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 19, 2004

Filed:

May. 05, 2000
Applicant:
Inventors:

Hironori Emaru, Yokohama, JP;

Masaharu Akatsu, Machida, JP;

Norifumi Nishikawa, Machida, JP;

Tetsuo Tanaka, Sagamihara, JP;

Akihiro Yoshikawa, Kawasaki, JP;

Shunsuke Akifuji, Wako, JP;

Gou Kojima, Yamato, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/5173 ;
U.S. Cl.
CPC ...
G06F 1/5173 ;

Find Patent Forward Citations

Emaru, Hironori. (2004). Performance monitoring method in a distributed processing system (U.S. Patent No. 6807575). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6807575

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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