The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 19, 2004
Filed:
Dec. 17, 2001
Applicant:
Inventors:
Lee Charles Kalem, Los Gatos, CA (US);
David Todd Dieken, Santa Clara, CA (US);
Assignee:
Agilent Technologies, Inc., Palo Alto, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 1/300 ;
U.S. Cl.
CPC ...
G01R 1/300 ;
Abstract
A method and system for determining and compensating for phase and time errors in an optical receiver. The method and system includes use of a measurement and reference signal; deriving phase and time errors; and providing compensation values to the optical receiver. The operating frequency and/or other operating parameters associated with phase and time errors are determined and recorded to allow for proper compensation to the optical receiver.
Kalem, Lee. (2004). Laser measurement system with digital delay compensation (U.S. Patent No. 6807497). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6807497
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile