The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 19, 2004
Filed:
Jun. 27, 2002
Wavelength inspection method of a semiconductor laser diode and a wavelength inspection unit thereof
Applicant:
Inventors:
Haruyoshi Ono, Yamanashi, JP;
Isao Baba, Yamanashi, JP;
Assignee:
Fujitsu Quantum Devices Limited, Yamanshi, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01S 3/10 ; H01S 3/13 ;
U.S. Cl.
CPC ...
H01S 3/10 ; H01S 3/13 ;
Abstract
In order to tune an oscillation wavelength of a semiconductor laser diode to a target wavelength, the amount of change of a wavelength to the amount of change of a wavelength varying item is determined by actual measurement and a basic wavelength coefficient is renewed by using the ratio of both amounts of change as a corrective wavelength coefficient, and thus the characteristic when the wavelength of an actual device is made closer to a target wavelength is utilized.