The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 19, 2004
Filed:
Dec. 27, 2000
Takeshi Nakajima, Nara, JP;
Shinichi Konishi, Nara, JP;
Harumitsu Miyashita, Minoo, JP;
Toshihiko Takahashi, Kawachinagano, JP;
Matsushita Electric Industrial Co., Ltd., Osaka, JP;
Abstract
An asymmetry detection apparatus includes: a clock signal generator for generating a clock signal based on a reproduced signal; an A/D converter for sampling the reproduced signal in synchronization with the clock signal; a determiner for determining whether a level of each of a plurality of sampled data obtained by the sampling operation is equal to or greater than a predetermined level; and a detector for detecting asymmetry in the reproduced signal by using predetermined ones of the sampled data based on an output from the determiner. A jitter detection apparatus includes: a clock signal generator for generating a clock signal based on a reproduced signal; an A/D converter for sampling the reproduced signal in synchronization with the clock signal; a determiner for determining whether a level of each of a plurality of sampled data obtained by the sampling operation is equal to or greater than a predetermined level; and a detector for detecting jitter in the reproduced signal by using predetermined ones of the plurality of sampled data based on an output from the determiner.